GAIA, J.; SANDERS, G. L.; SANDERS, S. P.; UPADHYAYA, S.; WANG, X.; YOO, C. W. Dark Traits and Hacking Potential. Journal of Organizational Psychology, [S. l.], v. 21, n. 3, 2021. DOI: 10.33423/jop.v21i3.4307. Disponível em: https://mail.articlegateway.com/index.php/JOP/article/view/4307. Acesso em: 5 nov. 2024.